| dc.contributor.author | INSTITUTE OF CHARTERED ACCOUNTANT GHANA, ICAG | |
| dc.date.accessioned | 2022-07-22T16:07:30Z | |
| dc.date.available | 2022-07-22T16:07:30Z | |
| dc.date.issued | 2018-05 | |
| dc.identifier.uri | http://41.66.247.10:8080/xmlui/handle/123456789/545 | |
| dc.description | GENERAL PERFORMANCE OF CANDIDATES Performance of candidates fell below expectation considering the level of difficulty of the questions. Candidates approach to the questions appeared very amateurish. They did not display maturity and in-depth reasoning required at this level. Answers were shallow and sometimes long and winding. However, the lengthy and unproductive preambles to answers that characterised previous papers were happily absent. Common faults discovered were wrong numbering of answers, failure to number papers in the booklet and not making reference to papers where answers were continued after a break. | en_US |
| dc.description.abstract | STANDARD OF THE PAPER The topics featured in the paper were all within the scope of the syllabus. Generally, the paper was up to the required standard. In terms of syllabus coverage and marks allocation, this paper is graded as the best in recent times. All the nine sections of the syllabus were featured and the marks allocation followed strictly the syllabus weighting. The suggested solutions adequately responded to the requirements of the questions and the marking scheme was structured with fairness to the candidates in mind and the nature of the questions. | en_US |
| dc.description.sponsorship | ICAG | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | ICAG LIBRARY | en_US |
| dc.relation.ispartofseries | AAA;PAPER 3.2 | |
| dc.subject | MAY 2018 PROFESSIONAL EXAMINATIONS ADVANCED AUDIT & ASSURANCE (PAPER 3.2) CHIEF EXAMINER’S REPORT, QUESTIONS AND MARKING SCHEME ICAG LIBRARY NYARKO TWUM OSBORN ERNEST YAW DENKYIRA | en_US |
| dc.title | ADVANCED AUDIT & ASSURANCE (PAPER 3.2) | en_US |
| dc.title.alternative | AAA PAPER 3.2 | en_US |
| dc.type | Learning Object | en_US |